Calculation of defects in silicon by a new tight-binding model

Chinese Physics Letters

Volumn 17, Issue 3, 2000, Pages 215-217

  Pei, Min ^a   Wang, Wei ^a   Pan, Bi Cai ^a   Li, Yong Ping ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ELECTRONIC PROPERTIES; SILICON;

CRYSTALLINE SILICONS; DEFECT CONFIGURATIONS; DI-VACANCY DEFECTS; EXPERIMENTAL VALUES; FORMATION ENERGIES; GAP STATE; MONOVACANCIES; STRUCTURAL AND ELECTRONIC PROPERTIES; SUPER CELL; TIGHT-BINDING MODELING;

DEFECTS;

EID: 0034379424     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/17/3/021     Document Type: Article

References (15)

1. B. G. Svensson and M. Willander, J. Appl. Phys. 62 (1987) 2758.
2. A. D. Evwaraye, E. Sun, J. Appl. Phys. 47 (1976) 3776.
3. A. D. Evwaraye, E. Sun, J. Appl. Phys. 47 (1976) 3172.
4. R. Car et al., Phys. Rev. Lett. 52 (1984) 1814.
5. E. G. Song, E. Kim, Y. H. Lee, Y. G. Hwang, Phys. Rev. B 48 (1993) 1486.
6. S. J. Clark and G. J. Ackland, Phys. Rev. B 56 (1997) 47.
7. Hyangsuk Scong and Laurent J. Lewis, Phys. Rev. B 53 (1996) 9791.
8. SHEN Bo et al., Chin. Phys. Lett. 14 (1997) 436.
9. C. Z. Wang, C. T. Chan and K. M. Ho, Phys. Rev. Lett. 66 (1991) 189.
10. I. Kwon et al., Phys. Rev. B 49 (1994) 7242.
11. G. H. Glimer et al., Phys. Rev. B 102 (1995) 247.
12. L. Goodwin, A. J. Skinner and D. G. Pettifor, Europhys. Lett. 9 (1989) 701.
13. C. Z. Wang, B. C. Pan and K. M. Ho, J. Phys.:Condens. Matter. 11 (1999) 2043; C. Z. Wang, M. S. Tang, B. C. Pan, C. T. Chan and K. M. Ho, Materials Research Society Proceedings, edited by E. Kaxiras et al., (Materials Research Society, Pittsburgh, 1995) Vol. 408.
14. C. Z. Wang, B. C. Pan and K. M. Ho, J. Phys.:Condens. Matter. 11 (1999) 2043; C. Z. Wang, M. S. Tang, B. C. Pan, C. T. Chan and K. M. Ho, Materials Research Society Proceedings, edited by E. Kaxiras et al., (Materials Research Society, Pittsburgh, 1995) Vol. 408.
15. K. M. Ho et al., Nature, 392 (1998) 582.