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Volumn 220, Issue 1, 2000, Pages 117-125

High-resolution spectroscopy with reciprocal-space analysis: Application to isotopically pure Si

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EID: 0034341668     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200007)220:1<117::AID-PSSB117>3.0.CO;2-4     Document Type: Article
Times cited : (6)

References (19)
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    • D. E. ASPNES, Surf. Sci. 135, 284 (1983) D. E. ASPNES and H. ARWIN, J. Opt. Soc. Amer. 73, 1759 (1983).
    • (1983) Surf. Sci. , vol.135 , pp. 284
    • Aspnes, D.E.1
  • 10
    • 0032630870 scopus 로고    scopus 로고
    • S. HAYKIN and S. KESSLER, in: Nonlinear Methods of Spectral Analysis, Topics in Applied Physics, Vol. 34, Ed. S. HAYKIN, Springer-Verlag Berlin 1979 N. S. MCINTYRE, A. R. PRATT, H. PIAO, D. MAYBURY, and S. J. SPLINTER, Appl. Surf. Sci. 144/145, 156 (1999).
    • (1999) Appl. Surf. Sci. , vol.144-145 , pp. 156
    • McIntyre, N.S.1    Pratt, A.R.2    Piao, H.3    Maybury, D.4    Splinter, S.J.5
  • 15
    • 0004204702 scopus 로고
    • Oxford University Press, Oxford
    • J. EMSLEY, The Elements, Oxford University Press, Oxford 1991.
    • (1991) The Elements
    • Emsley, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.