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Volumn 220, Issue 1, 2000, Pages 71-77

The fractional-dimensional space approach: Excitons and shallow impurities in semiconductor low-dimensional systems

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EID: 0034341659     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200007)220:1<71::AID-PSSB71>3.0.CO;2-N     Document Type: Article
Times cited : (13)

References (28)
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