A safe low temperature route to nanocrystalline transition metal arsenides

Chemistry Letters

Volumn , Issue 2, 2000, Pages 114-115

  Xie, Yi ^a   Lu, Jun ^a   Yan, Ping ^a   Jiang, Xuchuan ^a   Qian, Yitai ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034335959     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.2000.114     Document Type: Article

References (20)

1. a) A. C. Jones, Chem. Soc. Rev., 1997 101.
2. b) T. J. Cumberbatch and A. Putuis, Mater. Res. Soc. Symp. Proc., 164, 129 (1990).
3. E. K. Bryne, L. Parkanyi, and K. H. Theopold, Science, 241, 332 (1988).
4. D. Gammon, E. S. Snow, B. V. Shanabrook, D. S. Kater, and D. Parks, Science, 273, 87 (1996).
5. J. C. Bailer, H. J. Emelius, R. Nyholm and A. F. Trotman -Dickenson, "Comprehensive in Organic Chemistry," Pergamon Press, Oxford (1973), Vol. 2.
6. a) Y. A. Shian, L. J. Chang, and Chen, J. Electron. Mater., 17, 433 (1988).
7. b) R. L. Wells, Coord. Chem. Rev., 112, 273 (1992).
8. c) L. Butter, G. Redmond and D. Fitzmaurice, Phys. Chem., 97, 10570 (1993).
9. J. Coetzer, and V. I. Louw, Programme 3 patent holdings, PCT Int. Appl. WO 94 23,467 (Cl. H01M10/39) 13 Oct. 1994. ZA Appl. 93/2406, 02 Apr 1993,36 pp; Chem. Abstr., 122, 60155b (1995).
10. B. Aronsson, T. Landstron, and S. Rundouist, "Borides, Suicides and Phosphides," Wiley, New York 1965.
11. a) T. F. Kuech and E. Venhoff, J. Cryst. Growth, 68, 148 (1984).
12. b) J. C. Fitzmaurice, A. Hector and I. P. Parkin, J. Mater. Sci. Lett., 13, 1 (1994).
13. c) J. C. Fitzmaurice, I. P. Parkin, and A. T. Rowley, J. Mater. Chem., 4, 285 (1994).
14. a) T. J. Trentler, K. M. Hickman, M. Y. Chiang, S. C. Goel, A. M. Viano, P. C. Gibbons, and W. E. Buhro, Science, 270, 1791 (1995).
15. b) T. J. Trentler, S. C. Goel, K. M. Hickman, A. M. Viano, M. Y. Chiang. A. M. Beatty, P. C. Gibbons, and W. E. Buhro, J. Am. Chem. Soc., 119, 2172 (1997).
16. X. M. Zhang, C. Wang, X. F. Qian, Y. Xie, and Y. T. Qian, J Solid State Chem., 144, 237 (1999).
17. W. R. Penrose, CRc. Crit. Rev. Environ. Control, 1974 465.
18. H. Bönnemann, W. Brijous and T. Joussen, Angew. Chem., Int. Ed. Engl., 29, 273 (1990).
19. XRD patterns were obtained on a Japan Rigaku D/Max γA rotation anode X-ray diffractometer with Ni-filtered CuKα radiation (λ=1.54178 Å). TEM measurements were made on a Hitachi H-800 transmission electron microscope, using an accelerating voltage of 200 KV.
20. Joint Committee on Powder Diffraction Standards (JCPDS), File No. 12-799 FeAs; 9-94 CoAs; 31-900 NiAs.