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Volumn 219, Issue 4, 2000, Pages 346-352
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Effect of solution thickness on ZnSe crystals grown from Se/Te mixed solutions
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL ORIENTATION;
MASS SPECTROMETRY;
PHOTOLUMINESCENCE;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTING SELENIUM;
SEMICONDUCTING TELLURIUM;
SEMICONDUCTOR GROWTH;
SINGLE CRYSTALS;
SOLUTIONS;
THERMAL EFFECTS;
X RAY CRYSTALLOGRAPHY;
FULL WIDTH AT HALF MAXIMUM (FWHM);
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (ICP-MS);
X RAY ROCKING CURVES (XRC);
SEMICONDUCTING ZINC COMPOUNDS;
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EID: 0034325640
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00662-X Document Type: Article |
Times cited : (3)
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References (25)
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