An electron ion coincidence spectrometer for single and double photoionization studies

Measurement Science and Technology

Volumn 9, Issue 6, 1998, Pages 922-929

  Field, Thomas A ^a   Eland, John H D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Coincidence techniques; Doubly charged ions; Ion spectroscopy; Photoionization; Singly charged ions

Indexed keywords

SPECTROMETERS; SPECTROSCOPY;

ELECTRON ION COINCIDENCE SPECTROSCOPY;

PHOTOIONIZATION;

EID: 0032096680     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/6/009     Document Type: Article

References (21)

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21. Field T A and Eland J H D in preparation