Properties and stability of bismuth doped tin oxide thin films deposited on various types of glass substrates

Materials Research Society Symposium - Proceedings

Volumn 424, Issue , 1996, Pages 355-360

  Foglietti, V ^a   D'Alessandro, A ^a   Galbato, A ^a   Alessandri, A ^a   Beccherelli, R ^a   Campoli, F ^a   Petrocco, S ^a   Wnek, M ^a   Maltese, P ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; BOROSILICATE GLASS; DEPOSITION; ELECTRIC CONDUCTIVITY OF SOLIDS; FERROELECTRIC DEVICES; LIQUID CRYSTAL DISPLAYS; PYROLYSIS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR DOPING; SUBSTRATES; THIN FILMS; TRANSPARENCY;

SODA LIME GLASSES; SPRAY PYROLYSIS; TIN OXIDES;

SEMICONDUCTING FILMS;

EID: 0030410705     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-424-355     Document Type: Conference Paper

References (9)