Geometrical non-uniformities in the sensitivity of polycrystalline diamond radiation detectors

Diamond and Related Materials

Volumn 9, Issue 11, 2000, Pages 1850-1855

  Tromson, D ^a   Brambilla, A ^a   Foulon, F ^a   Mer, C ^a   Guizard, B ^a   Barrett, R ^b   Bergonzo, P ^a  

^a CEA SACLAY   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; GRAIN BOUNDARIES; OPTICAL CORRELATION; PARTICLE DETECTORS; PHOTOCURRENTS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION;

MICRO X-RAY BEAM PHOTOCURRENTS; POLYCRYSTALLINE DIAMOND RADIATION DETECTORS;

DIAMONDS;

EID: 0034324287     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(00)00334-4     Document Type: Article

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