GDOES depth profiling analysis of the air-formed oxide film on a sputter-deposited Type 304 stainless steel

Surface and Interface Analysis

Volumn 29, Issue 11, 2000, Pages 743-746

  Shimizu, K ^a   Habazaki, H ^b   Skeledon, P ^c   Thompson, G E ^c   Wood, G C ^c  

^a KEIO UNIVERSITY   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; EMISSION SPECTROSCOPY; GLOW DISCHARGES; IRON OXIDES; NICKEL COMPOUNDS; SPUTTER DEPOSITION; STAINLESS STEEL;

CHROMIUM OXIDE; DEPTH PROFILING; GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GDOES); NICKEL OXIDE;

FILM GROWTH;

EID: 0034322795     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200011)29:11<743::AID-SIA921>3.0.CO;2-Q     Document Type: Article

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