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Volumn 29, Issue 11, 2000, Pages 1333-1339

Electrochemical capacitance voltage profiling of the narrow band gap semiconductor InAs

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CARRIER CONCENTRATION; ELECTROCHEMISTRY; FERMI LEVEL; HALL EFFECT; INFRARED DETECTORS; MOLECULAR BEAM EPITAXY; RADIATION DETECTORS; TRANSISTORS; VOLTAGE MEASUREMENT;

EID: 0034321522     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-000-0134-0     Document Type: Article
Times cited : (14)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.