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Volumn 29, Issue 11, 2000, Pages 1333-1339
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Electrochemical capacitance voltage profiling of the narrow band gap semiconductor InAs
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE MEASUREMENT;
CARRIER CONCENTRATION;
ELECTROCHEMISTRY;
FERMI LEVEL;
HALL EFFECT;
INFRARED DETECTORS;
MOLECULAR BEAM EPITAXY;
RADIATION DETECTORS;
TRANSISTORS;
VOLTAGE MEASUREMENT;
NARROW BAND GAP COMPOUND SEMICONDUCTORS;
SCHOTTKY CONTACTS;
SEMICONDUCTING INDIUM COMPOUNDS;
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EID: 0034321522
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-000-0134-0 Document Type: Article |
Times cited : (14)
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References (8)
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