Evidence for misfit dislocation-related carrier accumulation at the InAs/GaP heterointerface

Applied Physics Letters

Volumn 72, Issue 18, 1998, Pages 2319-2321

  Gopal, V ^a   Kvam, E P ^a   Chin, T P ^a   Woodall, J M ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041422859     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121348     Document Type: Article

References (7)

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