Disappearance of intramolecular stacking due to one-atom movement or increment of a 'propylene linker' in pyrazolo3,4-cflpyrimidme-based flexible models

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 56, Issue 11, 2000, Pages 1361-1363

  Maulik, Prakas R ^a,b   Avasthi, Kamlakar ^a,b   Sarkhel, Sanjay ^a,b   Chandra, Tilak ^a,b   Rawat, Diwan S ^a,b   Logsdon, Brad ^a,b   Jacobson, Robert A ^a,b  

^a CENTRAL DRUG RESEARCH INSTITUTE   (India)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKYLATION; EVAPORATION; STACKING FAULTS; SYNTHESIS (CHEMICAL); X RAY CRYSTALLOGRAPHY;

METHYLATION;

CRYSTAL STRUCTURE;

EID: 0034321339     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270100010775     Document Type: Article

References (14)

1. Avasthi, K., Chandra, T. & Bhakuni, D. S. (1995). Indian J. Chem. Ser. B, 34, 944-949.
2. Avasthi, K., Rawat, D. S. & Bhakuni, D. S. (1998). Indian J. Chem. Ser. B, 37, 1228-1233.
3. Avasthi, K., Rawat, D. S., Chandra, T. & Bhakuni, D. S. (199S). Indian J. Chem. Ser. B, 37, 754-759.
4. Biswas, G., Chandra, T., Avasthi, K. & Maulik, P. R. (1995). Ada Cryst. CS1, 2453-2455.
5. Brown, D. T., Fisinger, J. & Leonard, N. J. (1968). J. Am. Chem. Soc. 90,7300-7323.
6. Gabe, E. J., Le Page, Y., Charland, J.-P., Lee, F. L. & White, P. S. (1989). J. Appl. Cryst. 22, 384-387.
7. Hobza, P. & Sponer, J. (1999). Chem. Rev. 99, 3247-3276.
8. Johnson, C K. (1965). ORTEP. Report ORNL-3794. Oak Ridge National Laboratory, Tennessee, USA.
9. Karcher, B. (1981). PhD thesis, Iowa State University, USA, pp. 64-90.
10. Maulik, P. R., Avasthi, K., Biswas, G., Biswas, S., Rawat, D. S., Sarkhel, S., Chandra, T. & Bhakuni, D. S. (1998). Acta Cryst. C54, 275-277.
11. Sheldrick, G. M. (1990). Acta Cryst. A46, 467-173.
12. Sheldrick, G. M. (1993). SHELXL93. University of Göttingen, Germany.
13. Sheldrick, G. M. (1997). SHELXL9T. University of Göttingen, Germany.
14. Siemens (1992). XSCANS User's Manual. Version 2.0. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.