Neural networks for HREM image analysis

Information sciences

Volumn 129, Issue 1-4, 2000, Pages 31-44

  Kirschner, Holger ^a   Hillebrand, Reinald ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE QUALITY;

COMPOUND SEMICONDUCTORS;

NEURAL NETWORKS;

EID: 0034318423     PISSN: 00200255     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-0255(00)00067-0     Document Type: Article

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