Characterization of silicon strip detectors with a binary readout chip for X-ray imaging

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 454, Issue 1, 2000, Pages 214-220

  Grybos P ^a   Bialas, W ^a   Cabal, A ^b   Dabrowski, W ^a   Giubellino, P ^b   Idzik, M ^a   Magana Mendoza, L ^b   Ramello, L ^c   Szczygiel, R ^d   Wheadon, R ^b  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b SEZIONE DI TORINO   (Italy)

^c UNIVERSITY OF EASTERN PIEDMONT   (Italy)

^d INSTITUTE OF NUCLEAR PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; READOUT SYSTEMS; SILICON SENSORS; X RAY SPECTROSCOPY;

SILICON STRIP DETECTORS;

PARTICLE DETECTORS;

EID: 0034318367     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(00)00830-5     Document Type: Article

References (6)

1. Datte P.et al. Nucl. Instr. and Meth. A. 421:1999;576.
2. Fischer P.et al. Nucl. Instr. and Meth. A. 405:1998;53.
3. Chatzisotiriou V.et al. Nucl. Instr. and Meth. A. 418:1998;173.
4. Weilhammer P.et al. Nucl. Instr. and Meth. A. 418:1998;173.
5. Dabrowski W.et al. Nucl. Instr. and Meth. A. 442:2000;346.
6. P. Gryboś et al., RX32 - A binary readout chip for X-ray imaging applications using silicon strip detectors, Proceedings of the Sixth International Conference on Mixed Design of Integrated Circuits and Systems, Krakow, Poland, June 1999.