Breakdown in conventional and vacuum microelectronics field emission devices

Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC

Volumn , Issue , 1996, Pages 10-18

  Charbonnier, Francis ^a  

^a Linfield Research Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMITTER ARRAYS (FEA); VACUUM MICROELECTRONIC (VM) DEVICES;

CARBIDES; CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; GATES (TRANSISTOR); MICROELECTRONICS; MOLYBDENUM; SILICON; SURFACE PHENOMENA; THERMAL CONDUCTIVITY OF SOLIDS; TRANSCONDUCTANCE; TUNGSTEN;

FIELD EMISSION CATHODES;

EID: 0030372703     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)