Preparation and optical properties of SiO2 thin films containing InP nanocrystals

Materials Research Bulletin

Volumn 35, Issue 14-15, 2000, Pages 2469-2477

  Zheng, Maojun ^a   Zhang, Lide ^a   Liu, Famin ^a   Li, Guanghai ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

Author keywords

A. Thin films; B. Sputtering; C. Raman spectroscopy; D. Optical properties

Indexed keywords

COMPOSITE MATERIALS; FILM PREPARATION; LIGHT ABSORPTION; LIGHT MODULATION; LIGHT TRANSMISSION; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PHONONS; RAMAN SPECTROSCOPY; SEMICONDUCTING INDIUM PHOSPHIDE; SILICA; TENSILE STRESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

RADIO FREQUENCY MAGNETRON COSPUTTERING;

OPTICAL FILMS;

EID: 0034312878     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(00)00451-7     Document Type: Article

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