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Volumn 245, Issue 1-2, 2000, Pages 190-195

In situ imaging of shearing contacts in the surface forces apparatus

Author keywords

Atomic force microscopy; Inorganic fullerenes; Multiple beam interferometry; Nanoparticles; Surface force apparatus

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; FULLERENES; INTERFACES (MATERIALS); INTERFEROMETRY; SHEAR STRESS; SURFACE MEASUREMENT;

EID: 0034303923     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(00)00478-6     Document Type: Article
Times cited : (23)

References (43)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.