SCOPUS 정보 검색 플랫폼

Wear

Volumn 245, Issue 1-2, 2000, Pages 190-195

In situ imaging of shearing contacts in the surface forces apparatus

(4) Golan, Yuval a Drummond, Carlos b Israelachvili, Jacob b Tenne, Reshef c

a BEN GURION UNIVERSITY OF THE NEGEV (Israel)

b University of California (United States)

c WEIZMANN INSTITUTE OF SCIENCE (Israel)

Author keywords

Atomic force microscopy; Inorganic fullerenes; Multiple beam interferometry; Nanoparticles; Surface force apparatus

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; FULLERENES; INTERFACES (MATERIALS); INTERFEROMETRY; SHEAR STRESS; SURFACE MEASUREMENT;

INORGANIC FULLERENES; MULTIPLE BEAM INTERFEROMETRY; SHEARING CONTACTS;

WEAR OF MATERIALS;

FULLERENE; IMAGING METHOD; INTERFEROMETRY; MICROSCOPY;

EID: 0034303923 PISSN: 00431648 EISSN: None Source Type: Journal
DOI: 10.1016/S0043-1648(00)00478-6 Document Type: Article

Times cited : (23)

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