Conduction mechanism in the off-state of thin Te48-yAs30+yGe10Si12 films

Journal of Physics D: Applied Physics

Volumn 33, Issue 19, 2000, Pages 2356-2362

  Hegab, N A ^a  

^a Ain Shams University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; EVAPORATION; GLASS; PERMITTIVITY; TELLURIUM COMPOUNDS; THERMAL EFFECTS; X RAY DIFFRACTION;

CHALCOGENIDE GLASSES;

THIN FILMS;

EID: 0034301464     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/19/302     Document Type: Article

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