Effect of sample topography on adhesive force in atomic force spectroscopy measurements in air

Langmuir

Volumn 16, Issue 20, 2000, Pages 7796-7800

  Sirghi, Lucel ^a,c   Nakagiri, Nobuyuki ^b   Sugisaki, Katsumi ^b   Sugimura, Hiroyuki ^a   Takai, Osamu ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b NIKON CORPORATION   (Japan)

^c ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AIR; APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; CAPILLARITY; MATHEMATICAL MODELS; SILICON NITRIDE; SPECTROSCOPIC ANALYSIS; SURFACE TENSION; THERMODYNAMIC PROPERTIES; WATER;

ADHESIVE FORCE; THERMODYNAMIC EQUILIBRIUM; WATER MENISCUS;

SURFACE TOPOGRAPHY;

EID: 0034301031     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la000392n     Document Type: Article

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