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Volumn 113, Issue 14, 2000, Pages 5947-5953
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The role of micro- and nanomorphology of rough silver surfaces of different nature in surface enhanced Raman scattering effect: A combined study of scanning force microscopy and low-frequency Raman modes
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Author keywords
[No Author keywords available]
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Indexed keywords
COLLOIDS;
MICROSCOPIC EXAMINATION;
MORPHOLOGY;
PLASMA APPLICATIONS;
RAMAN SPECTROSCOPY;
REDOX REACTIONS;
SILICON WAFERS;
SUBSTRATES;
SURFACE ROUGHNESS;
PLASMA ROUGHENING;
SCANNING FORCE MICROSCOPY;
SURFACE ENHANCED RAMAN SCATTERING (SERS);
SILVER;
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EID: 0034300187
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (40)
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References (18)
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