Formation and stability of II-VI self-assembled quantum dots revealed by in situ atomic force microscopy

Applied Surface Science

Volumn 166, Issue 1, 2000, Pages 332-335

  Kratzert, P R ^a   Rabe, M ^a   Henneberger, F ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ACTIVATION; IN SITU PROCESSING; MORPHOLOGY; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; THERMOANALYSIS; THERMODYNAMIC STABILITY;

SELF-ASSEMBLED QUANTUM DOTS; ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY (UHV-AFM);

SEMICONDUCTOR QUANTUM DOTS;

EID: 0034300180     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00476-1     Document Type: Article

References (9)

1. Seifert W.et al. J. Cryst. Growth Charact. Mater. 33:1996;423.
2. Rabe M.et al. J. Cryst. Growth. 184/185:1998;248.
3. Kirmse H.et al. Appl. Phys. Lett. 72:1998;1329.
4. Rabe M.et al. Proc. of the 24th ICPS, Jerusalem:1998.
5. Lee S.et al. Phys. Rev. Lett. 81:1998;3479.
6. Hommel D.et al. Phys. Status Solidi B. 202:1997;835.
7. Smathers J.B.et al. Appl. Phys. Lett. 72:1998;1238.
8. Ma Z.H.et al. Appl.Phys. Lett. 73:1998;1340.
9. Grün M.et al. Appl. Phys. Lett. 73:1998;1343.