Automatic IC orientation checks

Machine Vision and Applications

Volumn 12, Issue 3, 2000, Pages 107-112

  Kassim, A A ^a   Zhou, H ^a   Ranganath, S ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE ALGORITHMS; AUTOMATIC TESTING; COMPUTER VISION; ELECTRONICS PACKAGING;

ADAPTIVE DOUBLE THRESHOLDING ALGORITHMS;

INTEGRATED CIRCUIT TESTING;

EID: 0034300011     PISSN: 09328092     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001380050129     Document Type: Article

References (9)

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