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Volumn 54, Issue 3, 2000, Pages 285-300

S-induced destabilization of aluminum oxide at the Fe(poly)-S-Al2O3 interface

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; AUGER ELECTRON SPECTROSCOPY; DIFFUSION; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); IRON; REDUCTION; STOICHIOMETRY; SULFUR;

EID: 0034299893     PISSN: 0030770X     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1004602412849     Document Type: Article
Times cited : (4)

References (36)
  • 8
    • 0343087128 scopus 로고    scopus 로고
    • San Diego, CA, 3-5 May, 1998, P. Y. Hou, M. J. McNallan, R. Oltra, E. J. Opila, and D. A Shores, eds. The Electrochemical Society
    • J. A. Kelber, S. G. Addepalli, J.-S. Lin, and H. Cabibil, Proc. Electrochem. Soc. Symp. High Temp. Corros. Mater. Chem., San Diego, CA, 3-5 May, 1998, P. Y. Hou, M. J. McNallan, R. Oltra, E. J. Opila, and D. A Shores, eds. (The Electrochemical Society, 1998), pp. 190-197.
    • (1998) Proc. Electrochem. Soc. Symp. High Temp. Corros. Mater. Chem. , pp. 190-197
    • Kelber, J.A.1    Addepalli, S.G.2    Lin, J.-S.3    Cabibil, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.