Raman spectroscopy of surface phonons on Sb-terminated Si(001)

Applied Surface Science

Volumn 166, Issue 1, 2000, Pages 185-189

  Hinrichs, K ^a   Power, J R ^a   Esser, N ^a   Richter, W ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; LIGHT POLARIZATION; LOW ENERGY ELECTRON DIFFRACTION; OPTICAL CORRELATION; PHONONS; RAMAN SPECTROSCOPY; SEMICONDUCTING ANTIMONY;

SURFACE PHONONS;

SEMICONDUCTING SILICON;

EID: 0034299356     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00409-8     Document Type: Article

References (14)

1. Richter M., Woicik J.C., Nogami J., Pianetta P., Miyano K.E., Baski A.A., Kendelewicz T., Bouldin C.E., Spicer W.E., Quate C.F., Lindau I. Phys. Rev. Lett. 65:1990;3417.
2. Nogami J., Baski A.A., Quate C.F. Appl. Phys. Lett. 58:1991;475.
3. Cricenti A., Bernhoff H., Purdie D., Reihl B. J. Vac. Sci. Technol., A. 12:1994;2327.
4. Rich D.H., Leibsle F.M., Samsavar A., Hirschhorn E.S., Miller T., Chiang T.-C. Phys. Rev. B. 39:1989;12758.
5. Lee Y.J., Kim J.W., Kim S. J. Phys.: Condens. Matter. 9:1997;L583.
6. Dixon R.J., Conville C.F., Jenkins S.J., Srivastava G.P. Phys. Rev. B. 57:1998;R12701.
7. Wasserfall J., Ranke W. Surf. Sci. 331-333:1995;1099.
8. Power J.R., Farrell T., Gerber P., Chandola S., Weightman P., McGilp J.F. Appl. Phys. Lett. 69:1996;176.
9. Falta J., Bahr D., Hille A., Materlik G., Kammler M., Horn-von Hoegen M. Appl. Phys. Lett. 69:1996;2906.
10. Esser N., Geurts J. Bauer G., Richter W. Optical Characterisation of Epitaxial Semiconductor Layers. 1996;Springer, Berlin, Heidelberg, New York.
11. Hart T.R., Aggarwal R.L., Lax B. Phys. Rev. B. 1:1970;638.
12. Temple P.A., Hathaway C.E. Phys. Rev. B. 7:1973;3685.
13. Esser N., Hinrichs K., Power J.R., Richter W. Surf. Sci. 427-428:1999;44.
14. Tütüncü H.M., Jenkins S.J., Srivastava G.P. Surf. Sci. 402-404:1998;42.