Sensitive magnetometry based on nonlinear magneto-optical rotation

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 62, Issue 4, 2000, Pages 043403-043401

  Budker, D ^a,b   Kimball, D F ^a   Rochester, S M ^a   Yashchuk, V V ^a   Zolotorev, M ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTROMAGNETIC WAVE POLARIZATION; ELECTRON TRANSITIONS; ELECTRONIC DENSITY OF STATES; GROUND STATE; MAGNETIC FIELD EFFECTS; MAGNETIC RELAXATION; MAGNETIC VARIABLES MEASUREMENT; RUBIDIUM; SENSITIVITY ANALYSIS;

ATOMIC DENSITY; ATOMIC ENERGY LEVEL SHIFTS; MAGNETOMETRY; MAGNETOOPTICAL ROTATION; SHOT NOISE LIMITED SENSITIVITY;

MAGNETOOPTICAL EFFECTS;

EID: 0034298138     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (53)

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