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Volumn 69, Issue 3, 2000, Pages 320-324

Cross-talk simulation in CMOS micromachined gas-sensors with electrothermal actuation

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; CROSSTALK; ELECTRIC POTENTIAL; FINITE ELEMENT METHOD; HEAT RESISTANCE; PIEZOELECTRICITY; THERMISTORS; THERMOELECTRICITY;

EID: 0034294030     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(00)00480-9     Document Type: Article
Times cited : (1)

References (4)
  • 1
    • 58649095925 scopus 로고    scopus 로고
    • CMOS chemical microsensors based on resonant cantilever beams
    • Lange D., Koll A., Brand O., Baltes H. CMOS chemical microsensors based on resonant cantilever beams. Proc. SPIE, San Diego. 1998;233-243.
    • (1998) Proc. SPIE, San Diego , pp. 233-243
    • Lange, D.1    Koll, A.2    Brand, O.3    Baltes, H.4
  • 3
    • 0026152894 scopus 로고
    • Q-factor and frequency shift of resonating silicon diaphragms in air
    • Prak A., Blom F.R., Elvenspoek M., Lammerink T.S. Q-factor and frequency shift of resonating silicon diaphragms in air. Sens. Actuators, A. 27:1991;691-698.
    • (1991) Sens. Actuators, a , vol.27 , pp. 691-698
    • Prak, A.1    Blom, F.R.2    Elvenspoek, M.3    Lammerink, T.S.4
  • 4
    • 0002614116 scopus 로고
    • Dependence of the quality factor of micromachined silicon beam resonators on pressure and geometry
    • Blom F.R., Bouwstra S., Elwenspoek M., Fluitman J.H.J. Dependence of the quality factor of micromachined silicon beam resonators on pressure and geometry. J. Vac. Sci. Technol., B. 10(I):1992;19-26.
    • (1992) J. Vac. Sci. Technol., B , vol.10 , Issue.I , pp. 19-26
    • Blom, F.R.1    Bouwstra, S.2    Elwenspoek, M.3    Fluitman, J.H.J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.