Simulation of time-of-flight spectra in direct recoil spectrometry for the study of recoil depth distributions and multiple scattering contributions

Surface Science

Volumn 464, Issue 2-3, 2000, Pages 251-264

  Tassotto, Michael ^a   Watson, Philip R ^a  

^a OREGON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FERMI LEVEL; INTERFACES (MATERIALS); ION BOMBARDMENT; MATHEMATICAL MODELS; MORPHOLOGY; OPTICAL CORRELATION; PARAFFINS; SENSITIVITY ANALYSIS; SURFACE ROUGHNESS; SURFACE STRUCTURE; THIN FILMS;

THOMAS-FERMI TYPE POTENTIALS; TIME-OF-FLIGHT DIRECT RECOIL SPECTROMETRY (TOF-DRS);

DIAMOND FILMS;

EID: 0034291459     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00696-8     Document Type: Article

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