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Volumn 39, Issue 10 A, 2000, Pages

Picosecond time-resolved X-ray diffraction from Si(111) under high-power laser irradiation

Author keywords

[No Author keywords available]

Indexed keywords

HIGH POWER LASERS; IONIZATION; LATTICE VIBRATIONS; PULSED LASER APPLICATIONS; STRAIN; X RAY DIFFRACTION ANALYSIS;

FEMTOSECOND LASER; HIGH POWER LASER IRRADIATION; PICOSECOND TIME RESOLVED X RAY DIFFRACTION; PULSED X RAYS;

SEMICONDUCTING SILICON;

EID: 0034291359 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.39.l984 Document Type: Article

Times cited : (2)

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