|
Volumn 465, Issue 1-2, 2000, Pages 115-119
|
Core-level photoemission studies of the sulphur-terminated Si(100) surface
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DEPOSITION;
EMISSION SPECTROSCOPY;
MONOLAYERS;
PHOTOEMISSION;
SULFUR;
SURFACE PHENOMENA;
SYNCHROTRON RADIATION;
VACUUM APPLICATIONS;
SYNCHROTRON RADIATION PHOTOEMISSION SPECTROSCOPY;
SEMICONDUCTING SILICON;
|
EID: 0034291002
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(00)00675-0 Document Type: Article |
Times cited : (13)
|
References (17)
|