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Volumn 85, Issue 1, 2000, Pages 23-33
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Diffusion anisotropy of Ag and In on Si(1 1 1) surface studied by UHV- SEM
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Author keywords
Au Si superstructures; Diffusion anisotropy; Electromigration; Indium; Intermediate layer; SEM; Silver
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Indexed keywords
ANISOTROPY;
DIFFUSION IN SOLIDS;
ELECTROMIGRATION;
INDIUM;
SILICON;
SILVER;
SURFACE PROPERTIES;
VACUUM APPLICATIONS;
DIFFUSION ANISOTROPY;
INTERMEDIATE LAYER;
SCANNING ELECTRON MICROSCOPY;
INDIUM;
SILICON;
SILVER;
ADSORPTION;
ANISOTROPY;
ARTICLE;
DIFFUSION;
IMAGE ANALYSIS;
SCANNING ELECTRON MICROSCOPY;
TRANSPORT KINETICS;
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EID: 0034285102
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(00)00038-3 Document Type: Article |
Times cited : (7)
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References (26)
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