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Volumn 85, Issue 1, 2000, Pages 23-33

Diffusion anisotropy of Ag and In on Si(1 1 1) surface studied by UHV- SEM

Author keywords

Au Si superstructures; Diffusion anisotropy; Electromigration; Indium; Intermediate layer; SEM; Silver

Indexed keywords

ANISOTROPY; DIFFUSION IN SOLIDS; ELECTROMIGRATION; INDIUM; SILICON; SILVER; SURFACE PROPERTIES; VACUUM APPLICATIONS;

EID: 0034285102     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00038-3     Document Type: Article
Times cited : (7)

References (26)
  • 25
    • 85120133146 scopus 로고    scopus 로고
    • F.X. Shi, I. Shiraki, T. Nagao, S. Hasegawa, Surf. Sci. (2000), submitted for publication.
  • 26
    • 85120132871 scopus 로고    scopus 로고
    • F.X. Shi, I. Shiraki, T. Nagao, S. Hasegawa, Jpn. J. Appl. Phys. (2000), in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.