Exchange biasing effect in NiO/Co thin films

Physica Status Solidi (A) Applied Research

Volumn 181, Issue 1, 2000, Pages

  Smardz, L ^a  

^a INSTITUTE OF MOLECULAR PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; CRYSTAL STRUCTURE; GLASS; KERR MAGNETOOPTICAL EFFECT; MAGNETIC FIELD EFFECTS; MAGNETIZATION; MAGNETRON SPUTTERING; NICKEL COMPOUNDS; SEMICONDUCTING SILICON; SILICA; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

EXCHANGE BIASING EFFECT; GLASS SUBSTRATES; QUARTZ THICKNESS MONITOR; ULTRAHIGH VACUUM; X RAY FLUORESCENCE ANALYSIS;

THIN FILMS;

EID: 0034275217     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200009)181:13.0.CO;2-F     Document Type: Article

References (14)

1. W. H. MEIKLEJOHN, J. Appl. Phys. 33, 1328 (1962).
2. L. SMARDZ, U. KÖBLER, and W. ZINN, Vacuum 42, 283 (1991).
3. R. JUNGBLUT, R. COEHOORN, M. T. JOHNSON, CH. SAUER, P. J. VAN DER ZAAG, A. R. BALL, TH. G. S. M. RIJKS, J. AAN DE STEGGE, and A. REINDERS, J. Magn. Magn. Mater. 148, 300 (1995).
4. J. NOGUÉS and I. K. SCHULLER, J. Magn. Magn. Mater. 192, 203 (1999).
5. P. J. VAN DER ZAAG, A. R. BALL, L. F. FEINER, R. M. WOLF, and P. A. A. VAN DER HEIJDEN, J. Appl. Phys. 79, 5103 (1996).
6. Y. IJIRI, J. A. BORCHERS, R. W. ERWIN, S. H. LEE, P. J. VAN DER ZAAG, and R. M. WOLF, Phys. Rev. Lett. 80, 608 (1998).
7. L. SMARDZ, U. KÖBLER, and W. ZINN, J. Appl. Phys. 71, 5199 (1992).
8. D. MAURI, E. KAY, D. SCHOLL, and J. K. HOWARD, J. Appl. Phys. 62, 2929 (1987).
9. L. SMARDZ, J. Magn. Magn. Mater. 83, 119 (1990).
10. L. SMARDZ, U. KÖBLER, D. KERKMANN, W. SCHUMANN, D. PESCIA, and W. ZINN, Z. Phys. B - Cond. Matt. 80, 1 (1990).
11. L. SMARDZ, Solid State Comm. 112, 693 (1999).
12. M. J. CAREY and A. E. BERKOWITZ, Appl. Phys. Lett. 60, 3060 (1992).
13. L. SMARDZ and R. CZAJKA, unpublished results.
14. KENTARO TAKANO, R. H. KODAMA, A. E. BERKOVITZ, W. CAO, and G. THOMAS, Phys. Rev. Lett. 79, 1130 (1997).