Scanning tunneling microscopy study of AIanes/Al(lll): Contrasting neat and molecularly-terminated W tips

Journal of Physical Chemistry B

Volumn 104, Issue 35, 2000, Pages 8507-8511

  Go, Eden P ^a   Thuermer, Konrad ^a   Reutt Robey, Janice E ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MODIFICATION; CRYSTALS; ELECTRIC CONDUCTIVITY OF SOLIDS; FERMI LEVEL; MOLECULES; MORPHOLOGY; OLIGOMERS; SCANNING TUNNELING MICROSCOPY; STRUCTURE (COMPOSITION); SURFACE TOPOGRAPHY; TUNNEL JUNCTIONS; VACUUM APPLICATIONS;

ALANES; ALUMINUM CRYSTAL; ALUMINUM HYDRIDE OLIGOMER; REAL SPACE IMAGING; ULTRAHIGH VACUUM;

SEMICONDUCTING ALUMINUM COMPOUNDS;

EID: 0034274868     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp001212l     Document Type: Article

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33. Calculations were carried out in GAUSSIAN95 using the 6-316 OVGF basis set.