Refractive index of GaTe under high pressure

Semiconductor Science and Technology

Volumn 15, Issue 9, 2000, Pages 902-907

  Pellicer Porres, J ^a   Segura, A ^a   Munoz V ^a   Chervin, J C ^b  

^a UNIVERSITY OF VALENCIA   (Spain)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTROMAGNETIC DISPERSION; ENERGY GAP; HIGH PRESSURE EFFECTS IN SOLIDS; LIGHT POLARIZATION; REFRACTIVE INDEX; SEMICONDUCTING TELLURIUM;

CRYSTALLOGRAPHIC AXIS; PENN GAP;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0034273026     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/15/9/305     Document Type: Article

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