Characteristics of thick-film resistors, fired under dielectric layer

Journal of Materials Science Letters

Volumn 19, Issue 17, 2000, Pages 1551-1555

  Hrovat, M ^a   Belavic D ^b   Samardzija Z ^a   Holc, J ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b HIPOT   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CRYSTAL MICROSTRUCTURE; DIELECTRIC FILMS; ELECTRONICS PACKAGING; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN SIZE AND SHAPE; MULTICHIP MODULES; RESISTORS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES;

DIELECTRIC LAYERS; LASER TRIMMED RESISTORS;

THICK FILM DEVICES;

EID: 0034271085     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006725106255     Document Type: Article

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