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Volumn 39, Issue 9 A, 2000, Pages 5063-5068

Lateral solid-phase recrystallization from the crystal seed selectively formed by excimer laser annealing in Ge-ion-implanted amorphous silicon films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ANNEALING; ELECTRIC PROPERTIES; EXCIMER LASERS; GERMANIUM; GRAIN BOUNDARIES; ION IMPLANTATION; POLYCRYSTALLINE MATERIALS; RECRYSTALLIZATION (METALLURGY);

EID: 0034268728     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5063     Document Type: Article
Times cited : (3)

References (16)
  • 15
    • 33645042920 scopus 로고
    • Dr. Thesis. Faculty of Science, Keio University, Yokohama
    • M. K. Kang: Dr. Thesis. Faculty of Science, Keio University, Yokohama, 1995.
    • (1995)
    • Kang, M.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.