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Volumn 39, Issue 9 A, 2000, Pages 5063-5068
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Lateral solid-phase recrystallization from the crystal seed selectively formed by excimer laser annealing in Ge-ion-implanted amorphous silicon films
a a b b b c c a
a
KEIO UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
ANNEALING;
ELECTRIC PROPERTIES;
EXCIMER LASERS;
GERMANIUM;
GRAIN BOUNDARIES;
ION IMPLANTATION;
POLYCRYSTALLINE MATERIALS;
RECRYSTALLIZATION (METALLURGY);
CRYSTAL SEED;
LATERAL SOLID-PHASE RECRYSTALLIZATION;
THIN FILM TRANSISTORS;
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EID: 0034268728
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.39.5063 Document Type: Article |
Times cited : (3)
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References (16)
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