Unsupervised segmentation of surface defects

Proceedings - International Conference on Pattern Recognition

Volumn 4, Issue , 1996, Pages 356-360

  Iivarinen, Jukka ^a   Rauhamaa, Juhani ^b   Visa, Ari ^a  

^a AALTO UNIVERSITY   (Finland)

^b ABB OY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMAL MAPPING; FAULT DETECTION;

SEGMENTATION SCHEME; UNSUPERVISED NEURAL NETWORKS; UNSUPERVISED SEGMENTATION; VORONOI;

PATTERN RECOGNITION;

EID: 84880977353     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.1996.547445     Document Type: Conference Paper

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