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Volumn 18, Issue 5, 2000, Pages 2509-2512
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Dry via hole etching of GaAs using high-density Cl2/Ar plasma
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
ARGON;
CHLORINE;
DRY ETCHING;
MICROWAVES;
PRESSURE EFFECTS;
SEMICONDUCTOR PLASMAS;
HOLE ETCHING;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0034266706
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1289548 Document Type: Article |
Times cited : (12)
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References (17)
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