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Volumn 18, Issue 5, 2000, Pages 2509-2512

Dry via hole etching of GaAs using high-density Cl2/Ar plasma

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ARGON; CHLORINE; DRY ETCHING; MICROWAVES; PRESSURE EFFECTS; SEMICONDUCTOR PLASMAS;

EID: 0034266706     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1289548     Document Type: Article
Times cited : (12)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.