Interference method for determination of the refractive index and thickness

Optical Engineering

Volumn 39, Issue 9, 2000, Pages 2480-2486

  Alexandrov, Serguei A ^a   Chernyh, Igor V ^b  

^a RBP Optoelectronics   (Belarus)

^b Peleng Company   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATERIALS TESTING; MATHEMATICAL MODELS; OPTICAL MATERIALS; REFRACTIVE INDEX; REFRACTOMETERS; THICKNESS MEASUREMENT;

INTERFERENCE METHOD; LASER INTERFERENCE REFRACTOMETER AND THICKNESSMETER; REFRACTIVE INDEX MEASUREMENT;

INTERFEROMETRY;

EID: 0034266509     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1287583     Document Type: Article

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