Interference refractometer and thickness meter

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2782, Issue , 2004, Pages 778-785

  Alexandrov, Serguei A ^a   Chernyh, Igor V ^b   Korban, Valery N ^b  

^a Research and Development Centre LEMT   (Belarus)

^b Peleng Company   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL MODELS; GASEOUS MEDIA; LASER INTERFERENCE; OPTICAL CRYSTALS; PARALLEL SAMPLES; REFRACTIVE INDEX MEASUREMENT; SHEET MATERIAL; SIMULTANEOUS MEASUREMENT; THICKNESSMETER; WIDE SPECTRAL RANGE;

LIGHT REFRACTION; OPTICAL INSTRUMENTS; OPTICAL TESTING; REFRACTIVE INDEX; THICKNESS MEASUREMENT;

REFRACTOMETERS;

EID: 78951496037     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.250811     Document Type: Conference Paper

References (7)

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4. Timofeyeva N.F."Determination of the refractive index by means of interference method". Optico-mechan. prom. No. 10, pp. 17-19, 1935.
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7. Alexandrov S.A., Chernyh I.V., Predko K.G."Interferometric method for the detrmination of absolute refractive index and optical thickness". Proceed.SPIE Vol.2208, p.214, 1994.