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Volumn 19, Issue 3, 2000, Pages 185-186

Preliminary study on electrical and optical properties of ZnO film grown by MOCVD

Author keywords

MOCVD; Optical transmittance; Resistivity; ZnO

Indexed keywords

ELECTRIC PROPERTIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; ZINC OXIDE;

EID: 0034262265     PISSN: 10010521     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (5)
  • 3
    • 33746993121 scopus 로고    scopus 로고
    • JCPPS-Intemational Center for Diffraction Data, Powder Diffraction File, Sets 35 to 36,1601 Park Lane, Swarthmore, PA 19081-2389,1990,1048(36-1451)
    • JCPPS-Intemational Center for Diffraction Data, Powder Diffraction File, Sets 35 to 36,1601 Park Lane, Swarthmore, PA 19081-2389,1990,1048(36-1451)
  • 5
    • 33747009392 scopus 로고
    • Translated by Liu Xiangna, Jiang Ruolian and He Yuliang.Nanjiang: Press of Nanjing University
    • Pankove J I. Optoelectronic Process in Semiconductor .Translated by Liu Xiangna, Jiang Ruolian and He Yuliang.Nanjiang: Press of Nanjing University, 1992.104.
    • (1992) Optoelectronic Process in Semiconductor , pp. 104
    • Pankove, J.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.