Effect of film microstructure on exchange bias of IrMn/CoFe films

IEEE Transactions on Magnetics

Volumn 36, Issue 5 I, 2000, Pages 2620-2622

  Pakala, M ^a   Huai, Y ^a   Anderson, G ^a  

^a WESTERN DIGITAL CORPORATION   (United States)

Author keywords

Activation energy; Exchange bias; Microstructural effects; Temperature effects

Indexed keywords

ACTIVATION ENERGY; CRYSTAL MICROSTRUCTURE; DEPOSITION; GRAIN SIZE AND SHAPE; IRIDIUM COMPOUNDS; MAGNETIC HEADS; MAGNETIC RECORDING; MULTILAYERS; SURFACE ROUGHNESS; TEXTURES; THERMAL EFFECTS;

EXCHANGE BIAS;

MAGNETIC FILMS;

EID: 0034260614     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.908535     Document Type: Article

References (7)

1. Thermal fluctuation aftereffect model for some systems with ferromagnetic-antiferromagnetic coupling
2. Grain size effect on ferro-antiferromagnetic coupling of NiFe/FeMn systems
3. Effect of underlayer grain size, roughness and crystal texture on exchange coupled IrMn/CoFe thin films