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Volumn 8, Issue 3, 2001, Pages 337-340
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SiC bonding in (C60)nSim clusters
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
CHEMICAL BONDS;
DEPOSITION;
FREE FLIGHT;
FULLERENES;
MASS SPECTROMETERS;
MASS SPECTROMETRY;
MOLECULES;
PHOTOELECTRON SPECTROSCOPY;
RAMAN SCATTERING;
SILICON;
SILICON CARBIDE;
SUBSTRATES;
SURFACE SCATTERING;
THIN FILMS;
VAN DER WAALS FORCES;
CHEMICAL BONDINGS;
MASS SPECTROSCOPY;
NANOGRANULAR THIN FILM;
NEUTRAL CLUSTERS;
PHOTOFRAGMENTATION;
SURFACE ENHANCED RAMAN SCATTERING (SERS);
TIME-OF-FLIGHT MASS SPECTROMETERS;
X RAY PHOTOEMISSION SPECTROSCOPY;
SILICON COMPOUNDS;
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EID: 0034258297
PISSN: 14346060
EISSN: None
Source Type: Journal
DOI: 10.1007/s100530170124 Document Type: Article |
Times cited : (6)
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References (13)
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