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Solid State Communications

Volumn 99, Issue 6, 1996, Pages 445-449

Raman scattering studies on the C60 films deposited by ionized cluster beam deposition (ICBD) technique

(4) Shi, Y a Fan, X J a Guo, H X a Fu, Q a

a WUHAN UNIVERSITY (China)

Author keywords

A. fullerenes; A. thin films; E. ion impact

Indexed keywords

FILM PREPARATION; ION BEAMS; RAMAN SCATTERING;

IONIZED CLUSTER BEAM DEPOSITION;

FULLERENES;

EID: 0030213979 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1098(96)00281-5 Document Type: Article

Times cited : (9)

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