Structure determination of φ-Bi8Pb5O17 by electron and powder X-ray diffraction

Ultramicroscopy

Volumn 84, Issue 3-4, 2000, Pages 133-142

  Gemmi, M ^a,b   Righi, L ^a   Calestani, G ^a   Migliori, A ^a   Speghini, A ^c   Santarosa, M ^c   Bettinelli, M ^c  

^a CNR   (Italy)

^b UNIVERSITY OF BOLOGNA   (Italy)

^c UNIVERSITY OF VERONA   (Italy)

Author keywords

Electron crystallography; Electron diffraction; Ionic conductive material; Rietveld refinement

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; IONIC CONDUCTION; PHASE COMPOSITION; PHASE DIAGRAMS; PHASE TRANSITIONS; X RAY CRYSTALLOGRAPHY;

ELECTRON CRYSTALLOGRAPHY; IONIC CONDUCTIVE MATERIAL; RIETVELD REFINEMENT;

SEMICONDUCTING BISMUTH COMPOUNDS;

BISMUTH DERIVATIVE; LEAD OXIDE;

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; PHASE TRANSITION; STOICHIOMETRY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0034256035     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00007-3     Document Type: Article

References (20)

1. Honnart P., Boivin J.C., Thomas D., De Vries J.K. Solid State Ionics. 9&10:1983;921.
2. Fee M.G., Long N.J. Solid State Ionics. 86-88:1996;733.
3. Boivin J.C., Mairesse G. Chem. Mater. 10:1998;2870. and references therein.
4. Fee M.G., Sammes N.M., Tompsett G., Stoto T., Cartner A.M. Solid State Ionics. 95:1997;183.
5. Sillén L.G., Aurivillius B.Z. Kristallogr. 101:1939;483.
6. Santarosa M., Righi L., Gemmi M., Speghini A., Migliori A., Calestani G., Bettinelli M. J. Solid State Chem. 144:1999;255.
7. Watanabe A., Kitami Y., Takenouchi S., Bovin J.O., Sammes N. J. Solid State Chem. 144:1999;195.
8. Weirich T., Ramlau R., Simon A., Zou X.D., Hovmöeller S. Nature. 382:1996;144.
9. Gjønnes J., Hansen V., Berg B.S., Runde P., Gjønnes K., Dorset D.L., Gilmore C.J. Acta Crystallogr. A. 54:1998;306.
10. Belletti D., Calestani G., Migliori A., Gemmi M. Ultramicroscopy. 81:2000;57.
11. Zou X.D., Sukharev Y., Hovmöller S. Ultramicroscopy. 52:1993;436.
12. C. Giacovazzo, Direct Phasing in Crystallography, 1999, Oxford Science Publications, Oxford.
13. Sinkler W., Bengu E., Marks L.D. Acta Crystallogr. A. 54:1998;591.
14. Sinkler W., Marks L.D. Ultramicroscopy. 75:1999;251.
15. Migliori A., Gemmi M., Calestani G., Belletti D., Matacotta C.F., Dionigi C., Nozar P. Physica C. 328:1999;89.
16. Jansen J., Tang D., Zandbergen H.W., Schenk H. Acta Crystallogr. A. 58:1998;91.
17. Altomare A., Burla M.C., Camalli M., Carrozzini B., Cascarano G.L., Giacovazzo C., Guagliardi A., Moliterni A.G.G., Polidori G., Rizzi R. J. Appl. Crystallogr. 32:1999;339.
18. Altomare A., Burla M.C., Camalli M., Cascarano G.L., Giacovazzo C., Guagliardi A., Moliterni A.G.G., Polidori G., Spagna R. J. Appl. Crystallogr. 32:1999;115.
19. A.C. Larson, R.B. Von Dreele, GSAS, General Structure Analysis System, Los Alamos National Laboratory, NM 87545, USA, 1995.
20. Harwig H.A. Z. Anorg. Allgem. Chem. 444:1978;151.