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Volumn 85, Issue 1, 2000, Pages 65-69

Intrinsic thermal behaviour of capacitive pressure sensors: Mechanisms and minimization

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; OPTIMIZATION; PRESSURE GAGES; SILICON WAFERS; THERMOANALYSIS;

EID: 0034251342     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(00)00369-1     Document Type: Article
Times cited : (15)

References (19)
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  • 8
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  • 9
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    • Hanneborg, A.1    Ohlkers, P.2
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    • 0031673136 scopus 로고    scopus 로고
    • High-sensitivity silicon capacitive sensors for measuring medium-vacuum gas pressure
    • Catling D. High-sensitivity silicon capacitive sensors for measuring medium-vacuum gas pressure. Sensors and Actuators, A: Physical. 64:1998;157-164.
    • (1998) Sensors and Actuators, A: Physical , vol.64 , pp. 157-164
    • Catling, D.1
  • 12
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    • Simple technology for bulk accelerometer based on bond and etch back silicon on insulator wafers
    • Plaza J.A., Esteve J., Lora-Tomayo E. Simple technology for bulk accelerometer based on bond and etch back silicon on insulator wafers. Sensors and Actuators, A: Physical. 68(1-3):1998;299-302.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.