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Volumn 67, Issue 1, 2000, Pages 112-121

Applications of evanescent microwave probes in gas and chemical sensors

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; GAS ADSORPTION; HYDROGEN; MICROWAVE DEVICES; MICROWAVE MEASUREMENT; PALLADIUM; PROBES; SCANNING TUNNELING MICROSCOPY;

EID: 0034249669     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(00)00391-9     Document Type: Article
Times cited : (19)

References (18)
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  • 2
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  • 3
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    • An evanescent microwave probe for super-resolution nondestructive imaging of metals, semiconductors, dielectrics, composites and biological specimens
    • Pathak P., Tabib-Azar M., Ponchak G. An evanescent microwave probe for super-resolution nondestructive imaging of metals, semiconductors, dielectrics, composites and biological specimens. 1998 Conf. of Non-Destructive Testing, Anaheim, CA:1998.
    • (1998) 1998 Conf. of Non-Destructive Testing, Anaheim, CA
    • Pathak, P.1    Tabib-Azar, M.2    Ponchak, G.3
  • 4
    • 0001555410 scopus 로고    scopus 로고
    • 0.4 μm spatial resolution with 1 GHz evanescent microwave probe
    • Tabib-Azar M., Su D.-P., Pohar A., LeClair S.L. 0.4 μm spatial resolution with 1 GHz evanescent microwave probe. Rev. Sci. Instrum. 70(3):1999;1725-1729.
    • (1999) Rev. Sci. Instrum. , vol.70 , Issue.3 , pp. 1725-1729
    • Tabib-Azar, M.1    Su, D.-P.2    Pohar, A.3    Leclair, S.L.4
  • 5
    • 0032607216 scopus 로고    scopus 로고
    • Non-destructive superresolution imaging of defects, and non-uniformities in metals, composites, semiconductors, and dielectrics using evanescent microwaves
    • Tabib-Azar M., Pathak P.S., Ponchak G., LeClair S.R. Non-destructive superresolution imaging of defects, and non-uniformities in metals, composites, semiconductors, and dielectrics using evanescent microwaves. Rev. Sci. Instrum. 70(6):1999;2783-2792.
    • (1999) Rev. Sci. Instrum. , vol.70 , Issue.6 , pp. 2783-2792
    • Tabib-Azar, M.1    Pathak, P.S.2    Ponchak, G.3    Leclair, S.R.4
  • 7
    • 0342601626 scopus 로고    scopus 로고
    • Theoretical resolution of imaging with evanescent microwave probes
    • Tabib-Azar M. Theoretical resolution of imaging with evanescent microwave probes. IEEE Trans. Instrum. Meas. 48(6):1999.
    • (1999) IEEE Trans. Instrum. Meas. , vol.48 , Issue.6
    • Tabib-Azar, M.1
  • 8
    • 0032621079 scopus 로고    scopus 로고
    • Transient thermography using evanescent microwave microscope
    • Tabib-Azar M., Ciocan R., Ponchak G., LeClair S.R. Transient thermography using evanescent microwave microscope. Rev. Sci. Instrum. 70(8):1999;3387-3390.
    • (1999) Rev. Sci. Instrum. , vol.70 , Issue.8 , pp. 3387-3390
    • Tabib-Azar, M.1    Ciocan, R.2    Ponchak, G.3    Leclair, S.R.4
  • 14
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    • Fiber-optic bragg grating sensors for hydrogen gas sensing using the elasto-optic effect
    • Sutapun B., Tabib-Azar M., Kazemi A. Fiber-optic bragg grating sensors for hydrogen gas sensing using the elasto-optic effect. Sens. Actuators, A. 1999.
    • (1999) Sens. Actuators, A
    • Sutapun, B.1    Tabib-Azar, M.2    Kazemi, A.3
  • 15
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    • Highly sensitive hydrogen sensors using palladium coated fiber optics with exposed cores and evanescent field interactions
    • in press
    • Tabib-Azar M., Satupan B., Petrick R., Kazemi A. Highly sensitive hydrogen sensors using palladium coated fiber optics with exposed cores and evanescent field interactions. Sens. Actuators, A. 1999;. in press.
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    • Butler, M.A.1    Ginley, D.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.