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Volumn 68, Issue 1, 2000, Pages 48-52
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Structure and gas-sensitive properties of WO3-Bi2O3 mixed thick films
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Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH COMPOUNDS;
COMPOSITION;
MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
THICK FILMS;
TUNGSTEN COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
BISMUTH OXIDE;
GAS SENSITIVE ELECTRICAL PROPERTIES;
METAL OXIDES;
TUNGSTEN TRIOXIDE;
CHEMICAL SENSORS;
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EID: 0034248681
PISSN: 09254005
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-4005(00)00460-3 Document Type: Article |
Times cited : (52)
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References (8)
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