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Volumn 13, Issue 3, 2000, Pages 310-314

A new gas circulation RIE

Author keywords

Greenhouse effect; PFC; RIE; SiO2

Indexed keywords

AIR POLLUTION CONTROL; ARGON; CARBON MONOXIDE; FLOW OF FLUIDS; FLUOROCARBONS; GAS EMISSIONS; GLOBAL WARMING; GREENHOUSE EFFECT; REACTIVE ION ETCHING; SILICA;

EID: 0034247126     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.857941     Document Type: Article
Times cited : (2)

References (13)
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    • 33646146029 scopus 로고    scopus 로고
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    • Tokyo, Japan
    • S. Sasabe, "Countermeasures for global warming caused by PFC emissions: Research for alternative chemistries," in Proceedings SEMI Technol. Symp. 96, Tokyo, Japan, 1996, p. S-19.
    • (1996) Proceedings SEMI Technol. Symp. 96
    • Sasabe, S.1
  • 2
    • 0017526017 scopus 로고
    • Ion-surface interaction in plasma etching
    • J. W. Coburn, H. F. Winters, and T. J. Chuang, "Ion-surface interaction in plasma etching," J. Appl. Phys., vol. 48, p. 3532, 1977.
    • (1977) J. Appl. Phys. , vol.48 , pp. 3532
    • Coburn, J.W.1    Winters, H.F.2    Chuang, T.J.3
  • 3
    • 0018441483 scopus 로고
    • Plasma etching - A discussion of mechanism
    • J. W. Coburn and H. F. Winters, "Plasma etching - A discussion of mechanism," J. Vac. Sci. Technol., vol. 16, no. 2, p. 391, 1979.
    • (1979) J. Vac. Sci. Technol. , vol.16 , Issue.2 , pp. 391
    • Coburn, J.W.1    Winters, H.F.2
  • 10
    • 0029405218 scopus 로고
    • A new high-density plasma etching system using a dipolering magnet
    • M. Sekine, M. Marita, K. Horioka, Y. Yoshida, and H. Okano, "A new high-density plasma etching system using a dipolering magnet," Jpn. J. Appl. Phys, vol. 34, pp. 6274-6278, 1995.
    • (1995) Jpn. J. Appl. Phys , vol.34 , pp. 6274-6278
    • Sekine, M.1    Marita, M.2    Horioka, K.3    Yoshida, Y.4    Okano, H.5
  • 11
    • 0002865111 scopus 로고
    • Examination of selective etching and etching damage with mass-selected ion beam
    • Tokyo, Japan
    • T. Sakai, H. Hayashi, J. Abe, K. Horioka, and H. Okano, "Examination of selective etching and etching damage with mass-selected ion beam," in Proc. Dry Proc. Symp. 1993. Tokyo, Japan, 1993, p. 193.
    • (1993) Proc. Dry Proc. Symp. 1993 , pp. 193
    • Sakai, T.1    Hayashi, H.2    Abe, J.3    Horioka, K.4    Okano, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.