Selective trap filling induced by electron pulse excitation during TSC measurement in PbI2

Applied Physics A: Materials Science and Processing

Volumn 71, Issue 2, 2000, Pages 137-139

  Ponpon, J P ^a   Stuck, R ^a   Amann, M ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRON BEAMS; ELECTRON TRAPS; HOLE TRAPS; SINGLE CRYSTALS;

ELECTRON PULSE EXCITATION; LIGHT EXCITATION; SELECTIVE TRAP FILLING; THERMALLY STIMULATED CURRENT MEASUREMENT;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0034247021     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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