Characterization of lead iodide for nuclear spectrometers

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 380, Issue 1-2, 1996, Pages 193-197

  Schlesinger, T E ^a,e   James, R B ^a   Schieber, M ^a   Toney, J ^b   Van Scyoc, J M ^a   Salary, L ^a   Hermon, H ^a   Lund, J ^a   Burger, A ^f   Chen, K T ^f   Cross, E ^a   Soria, E ^a   Shah, K ^c   Squillante, M ^c   Yoon, H ^d   Goorsky, M ^d  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c RADIATION MONITORING DEVICES INC   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e CARNEGIE MELLON UNIVERSITY   (United States)

^f NONE

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; ETCHING; GAMMA RAY SPECTROMETERS; LOW TEMPERATURE EFFECTS; PHOTOLUMINESCENCE; PLASMAS; SEGREGATION (METALLOGRAPHY); X RAY DIFFRACTION; X RAY SPECTROMETERS; ZONE MELTING;

LEAD IODIDE; NUCLEAR SPECTROMETER; ZONE REFINING;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0030262396     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00343-9     Document Type: Article

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